Overview
The M29W128GL70ZS3E is a 128Mb 3V Embedded Parallel NOR Flash memory device manufactured by Micron Technology Inc. This device is built on 90nm single-level cell (SLC) technology and is designed for applications requiring high performance and reliability. The M29W128GL70ZS3E supports asynchronous random and page read operations, and it features a uniform block memory organization that allows for independent erasure of blocks, preserving valid data while old data is purged.
The device operates with a single low-voltage supply and includes an on-chip program/erase controller that simplifies the programming and erasing process. It also supports various protection mechanisms, including hardware and software protection, to secure blocks from unwanted modifications.
Key Specifications
Parameter | Description |
---|---|
Device Type | 128Mb (x8/x16) page, uniform block Flash memory |
Operating Voltage | VCC = 2.7–3.6V (program, erase, read), VCCQ = 1.65–3.6V (I/O buffers) |
Access Time | 70ns (random access), 25ns, 30ns (page access) |
Program Time | 16µs per byte/word (typ), 5s with VPPH, 8s without VPPH (chip program time) |
Memory Organization | 128 main blocks, 128-Kbytes or 64-Kwords each |
Package | 56-pin TSOP (14mm x 20mm), 64-ball TBGA (10mm x 13mm), 64-ball FBGA (11mm x 13mm) |
Temperature Range | –40°C to +125°C (automotive grade certified) |
Program/Erase Cycles | Minimum 100,000 cycles per block |
Protection | VPP/WP# pin protection, volatile and nonvolatile software protection, password protection |
Key Features
- Asynchronous random and page read operations
- Write to buffer program capability with 32-word (64-byte) and enhanced buffered program capability with 256 words
- Program/erase suspend and resume capability
- Unlock bypass, block erase, chip erase, and write to buffer commands
- Fast buffered/batch programming and fast block/chip erase
- Extended memory block for permanent, secure identification
- Common flash interface with 64-bit security code
- Low power consumption in standby and automatic mode
- RoHS compliant packages
- Automotive device grade temperature range
Applications
The M29W128GL70ZS3E is suitable for a variety of applications that require high-performance, reliable, and secure flash memory. These include:
- Automotive systems: Due to its automotive grade temperature range and certification, it is ideal for use in automotive electronics.
- Industrial control systems: The device's robustness and reliability make it a good fit for industrial control and automation systems.
- Consumer electronics: It can be used in various consumer electronics that require fast and secure data storage.
- Embedded systems: The device is well-suited for embedded systems that need efficient and secure memory solutions.
Q & A
- What is the operating voltage range of the M29W128GL70ZS3E?
The operating voltage range is VCC = 2.7–3.6V for program, erase, and read operations, and VCCQ = 1.65–3.6V for I/O buffers.
- What are the access times for random and page read operations?
The access times are 70ns for random access and 25ns or 30ns for page access.
- How many program/erase cycles can the device handle per block?
The device can handle a minimum of 100,000 program/erase cycles per block.
- What types of protection mechanisms are available on this device?
The device features VPP/WP# pin protection, volatile and nonvolatile software protection, and password protection).
- What are the available package options for the M29W128GL70ZS3E?
The device is available in 56-pin TSOP, 64-ball TBGA, and 64-ball FBGA packages).
- Is the M29W128GL70ZS3E RoHS compliant?
- What is the temperature range for the M29W128GL70ZS3E?
The device is certified for an automotive grade temperature range of –40°C to +125°C).
- How does the program/erase suspend and resume capability work?
The device allows reading from any block during a program suspend operation and reading or programming another block during an erase suspend operation).
- What is the purpose of the extended memory block?
The extended memory block is a 128-word (256-byte) space that can be programmed and protected to permanently secure its contents).
- Is the M29W128GL70ZS3E compatible with JEDEC standards?