Texas Instruments SCANSTA112VS/NOPB

The SCANSTA112VS/NOPB, produced by Texas Instruments, is a 7-port multidrop IEEE 1149.1 (JTAG) multiplexer designed to extend and manage JTAG test buses in complex systems. This device is part of a series that enables multi-drop addressing and multiplexing of IEEE-1149.1 scan chains, enhancing test throughput and facilitating system-wide structural testing and programming. It supports up to 7 local IEEE 1149.1-compatible scan chains, which can be accessed individually or combined serially, and is particularly useful in board-level and backplane test environments.

• True IEEE 1149.1 Hierarchical and Multidrop Capability: Supports up to 7 local IEEE 1149.1-compatible scan chains, which can be accessed individually or combined serially.
• Addressable Capability: 8 address inputs support up to 249 unique slot addresses, including interrogation address, broadcast address, and multi-cast group addresses.
• Bi-directional Backplane and LSP0 Ports: These ports are interchangeable and can act as master or slave ports, facilitating flexible test configurations.
• Stitcher Mode and Transparent Mode: Allows for bypassing level 1 and 2 protocols and enables the use of vectors without pad-bits or SCANSTA112 registers in the scan chain.
• Hierarchical Support: Multiple SCANSTA112 devices can be used to assemble a hierarchical boundary-scan tree, enabling selective communication with specific portions of a target system.

The SCANSTA112VS/NOPB is primarily used in:

• Board-Level Testing: To partition scan chains into manageable sizes and isolate specific devices onto separate chains, improving fault isolation and reducing test times.
• Backplane Testing: In multidrop backplane environments, allowing multiple IEEE-1149.1 accessible cards to utilize the same backplane test bus for system-level access.
• System-Wide Structural Testing and Programming: Facilitating a system-wide commitment to structural testing and programming throughout the entire system life cycle.

1. What is the primary function of the SCANSTA112VS/NOPB?

   The primary function is to extend and manage IEEE 1149.1 (JTAG) test buses in complex systems, supporting up to 7 local scan chains.

2. What package type does the SCANSTA112VS/NOPB come in?

   The device comes in a TQFP-100 (NEZ) package with 100 pins.

3. What is the propagation delay time of the SCANSTA112VS/NOPB?

   The propagation delay time is 12 ns.

4. What are the recommended operating supply voltage ranges for the SCANSTA112VS/NOPB?

   The recommended supply voltage range is 3.0V to 3.6V.

5. Can the backplane and LSP0 ports be configured as either master or slave?

   Yes, these ports are bi-directional and can be configured to act as either master or slave ports.

6. What is the purpose of the Stitcher Mode in the SCANSTA112VS/NOPB?

   The Stitcher Mode allows for bypassing level 1 and 2 protocols, enabling direct transition to operational mode.

7. How does the Transparent Mode operate in the SCANSTA112VS/NOPB?

   The Transparent Mode allows for the use of vectors without pad-bits or SCANSTA112 registers in the scan chain, available in both ScanBridge and Stitcher modes.

8. Can multiple SCANSTA112 devices be used to create a hierarchical boundary-scan tree?

   Yes, multiple devices can be used to assemble a hierarchical boundary-scan tree, enabling selective communication with specific portions of a target system.

9. What are the benefits of using the SCANSTA112VS/NOPB in board-level testing?

   The benefits include improved fault isolation, faster test times, faster programming times, and smaller vector sets.

10. What is the maximum junction temperature for the SCANSTA112VS/NOPB?

    The maximum junction temperature is +150°C.