Overview
The SCANSTA112VSX is a 7-port multidrop IEEE 1149.1 (JTAG) multiplexer produced by Texas Instruments. This device is designed to extend the IEEE 1149.1 test bus into a multidrop test environment, enhancing test throughput and facilitating the management of multiple scan chains.
Key Specifications
| Specification | Value |
|---|---|
| Interface | IEEE 1149.1 (JTAG) |
| Number of Local Scan Ports | 7 |
| Address Inputs | 8 (supporting up to 249 unique slot addresses, interrogation address, broadcast address, and 4 multi-cast group addresses) |
| Supply Voltage | 3.0 V to 3.6 V |
| Package/Case | 100-TQFP |
| Operating Temperature | -40°C to 85°C |
| RoHS Compliance | Yes (for NOPB versions) |
Key Features
- True IEEE 1149.1 Hierarchical and Multidrop Addressable Capability: Supports up to 249 unique slot addresses, an interrogation address, a broadcast address, and 4 multi-cast group addresses.
- Configurable Local Scan Ports: 7 IEEE 1149.1-compatible ports that can be accessed individually or combined serially.
- Bi-directional Backplane and LSP: Ports are interchangeable slave ports, capable of ignoring TRST of the backplane port when it becomes the slave.
- Stitcher Mode: Bypasses Level 1 and 2 protocols.
- Mode Register: Allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three.
- Transparent Mode: Can be enabled with a single instruction to buffer the backplane IEEE 1149.1 pins to those on a single local scan port.
- General Purpose Local Port Pass Through Bits: Useful for delivering write pulses for flash programming or monitoring device status.
- Known Power-Up State: TRST on all local scan ports.
- 32-bit TCK Counter and 16-bit LFSR Signature Compactor: Enhances test functionality.
- Live Insertion/Withdrawal Support: Allows for hot-swapping of modules without disrupting the system.
Applications
The SCANSTA112VSX is primarily used in testing equipment and complex electronic systems that require multiple scan chains to be managed efficiently. It is particularly useful in board-level testing, partitioning scan chains into manageable sizes or isolating specific devices onto separate chains. It also facilitates system-wide structural test and programming throughout the entire system life cycle in a multidrop backplane environment.
Q & A
- Q1: What is the primary function of the SCANSTA112VSX?
The primary function of the SCANSTA112VSX is to extend the IEEE 1149.1 test bus into a multidrop test environment, allowing for the management of multiple scan chains. - Q2: How many local scan ports does the SCANSTA112VSX support?
The SCANSTA112VSX supports 7 IEEE 1149.1-compatible local scan ports. - Q3: What is the supply voltage range for the SCANSTA112VSX?
The supply voltage range for the SCANSTA112VSX is 3.0 V to 3.6 V. - Q4: What type of package does the SCANSTA112VSX come in?
The SCANSTA112VSX comes in a 100-TQFP package. - Q5: Is the SCANSTA112VSX RoHS compliant?
Yes, the NOPB versions of the SCANSTA112VSX are RoHS compliant. - Q6: What is the operating temperature range for the SCANSTA112VSX?
The operating temperature range for the SCANSTA112VSX is -40°C to 85°C. - Q7: Can the SCANSTA112VSX support live insertion/withdrawal?
Yes, the SCANSTA112VSX supports live insertion/withdrawal. - Q8: How many unique slot addresses can the SCANSTA112VSX support?
The SCANSTA112VSX can support up to 249 unique slot addresses, along with an interrogation address, a broadcast address, and 4 multi-cast group addresses. - Q9: What is the purpose of the mode register in the SCANSTA112VSX?
The mode register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three. - Q10: Can the SCANSTA112VSX be used for flash programming?
Yes, the SCANSTA112VSX can be used for delivering write pulses for flash programming through its general purpose local port pass through bits.
