Overview
The OPA211AIDRGT from Texas Instruments is a precision operational amplifier that stands out for its exceptionally low noise and high performance. This device is part of the OPAx211 series, which is renowned for its 1.1 nV/√Hz noise density at 1 kHz and a low supply current of only 3.6 mA per channel. The OPA211AIDRGT is available in a small 8-pin WSON (DRG) package, making it suitable for a variety of applications where space is limited.
The amplifier features rail-to-rail output swing, which maximizes dynamic range, and is specified over a wide dual-power supply range of ±2.25 to ±18 V or single-supply operation from 4.5 to 36 V. Its high-speed and low noise characteristics make it an excellent choice for applications requiring high precision and reliability.
Key Specifications
| Parameter | Value | Unit |
|---|---|---|
| Input Voltage Noise Density | 1.1 | nV/√Hz at 1 kHz |
| Input Voltage Noise (0.1 to 10 Hz) | 80 | nVPP |
| THD + N | –136 dB | (G = 1, ƒ = 1 kHz) |
| Offset Voltage | 125 | µV (maximum) |
| Offset Voltage Drift | 0.35 | µV/°C (typical) |
| Supply Current | 3.6 | mA/Ch (typical) |
| Gain Bandwidth Product | 80 MHz (G = 100), 45 MHz (G = 1) | |
| Slew Rate | 27 | V/µs |
| Settling Time (16-Bit Accuracy) | 700 ns | |
| Supply Voltage Range | ±2.25 to ±18 V, 4.5 V to 36 V | |
| Output Current | 30 | mA |
| Operating Temperature Range | –40 to 125 | °C |
| Package Type | WSON (DRG), VSSOP-8, SOIC-8 |
Key Features
- Low Voltage Noise: 1.1 nV/√Hz at 1 kHz, making it suitable for high-precision applications.
- High-Speed Performance: Gain bandwidth product of 80 MHz (G = 100) and 45 MHz (G = 1), with a slew rate of 27 V/µs.
- Rail-to-Rail Output: Maximizes dynamic range and output swing.
- Low Supply Current: Only 3.6 mA per channel, ideal for power-sensitive applications.
- Unity-Gain Stable: Ensures stability in a variety of configurations.
- Wide Supply Range: Operates from ±2.25 to ±18 V or 4.5 to 36 V, offering flexibility in system design.
- High Accuracy: 700-ns settling time to 16-bit accuracy, suitable for driving high-precision ADCs and DACs.
Applications
- Ultrasound Scanners: High precision and low noise make it ideal for medical imaging applications.
- Semiconductor Test: Used in high-precision test equipment for semiconductor manufacturing.
- X-ray Systems: Suitable for medical imaging systems requiring high accuracy and low noise.
- Lab and Field Instrumentation: Ideal for precision measurement instruments in various fields.
- Data Acquisition (DAQ): Used in precision data acquisition systems for high-resolution measurements.
- Radar and Wireless Communications Test: High-speed and low noise characteristics make it suitable for these applications.
- Seismic Data Acquisition: Used in seismic exploration for high-precision data collection.
- DC Power Supply, AC Source, Electronic Load: Suitable for various power supply and load testing applications.
- Power Analyzer and Source Measurement Unit (SMU): Used in high-precision power measurement and source measurement units.
Q & A
- What is the input voltage noise density of the OPA211AIDRGT?
The input voltage noise density is 1.1 nV/√Hz at 1 kHz.
- What is the typical supply current of the OPA211AIDRGT?
The typical supply current is 3.6 mA per channel.
- What is the gain bandwidth product of the OPA211AIDRGT?
The gain bandwidth product is 80 MHz (G = 100) and 45 MHz (G = 1).
- What is the slew rate of the OPA211AIDRGT?
The slew rate is 27 V/µs.
- What is the settling time to 16-bit accuracy for the OPA211AIDRGT?
The settling time is 700 ns.
- What is the output current capability of the OPA211AIDRGT?
The output current capability is 30 mA.
- What are the available package types for the OPA211AIDRGT?
The available package types are WSON (DRG), VSSOP-8, and SOIC-8.
- What is the operating temperature range of the OPA211AIDRGT?
The operating temperature range is –40 to 125°C.
- Is the OPA211AIDRGT unity-gain stable?
Yes, the OPA211AIDRGT is unity-gain stable.
- What are some typical applications of the OPA211AIDRGT?
Typical applications include ultrasound scanners, semiconductor test, X-ray systems, lab and field instrumentation, data acquisition, radar, wireless communications test, seismic data acquisition, and power analyzers.
