ADC12DJ3200AAVT
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Texas Instruments ADC12DJ3200AAVT

Manufacturer No:
ADC12DJ3200AAVT
Manufacturer:
Texas Instruments
Package:
Tape & Reel (TR)
Description:
IC ADC 144FCBGA
Delivery:
Payment:
iso14001
iso45001
iso9001
iso13485

Product Introduction

Overview

The ADC12DJ3200AAVT, produced by Texas Instruments, is a high-performance, RF-sampling, analog-to-digital converter (ADC) designed to handle a wide range of frequencies. This 12-bit ADC can directly sample input frequencies from DC to above 10 GHz, making it suitable for various high-bandwidth applications. It operates in both single-channel and dual-channel modes, offering flexibility in terms of channel count and Nyquist bandwidth. The device is built for harsh environments, including those with high radiation levels, and features advanced synchronization and digital down-conversion capabilities.

Key Specifications

Specification Value
Resolution 12-bit
Sampling Rate (Single-Channel Mode) Up to 6.4 GSPS
Sampling Rate (Dual-Channel Mode) Up to 3.2 GSPS per channel
Noise Floor (No Signal, VFS = 1.0 V PP-DIFF) Dual-Channel Mode: –151.8 dBFS/Hz, Single-Channel Mode: –154.6 dBFS/Hz
Harmonic Distortion (HD2, HD3) –65 dBc up to 3 GHz
Analog Input Bandwidth (–3 dB) 8.0 GHz
Usable Input Frequency Range >10 GHz
Full-Scale Input Voltage (VFS, default) 0.8 V PP
Analog Input Common-Mode (VICM) 0 V
Output Interface JESD204B subclass-1 compliant, up to 16 lanes, maximum lane rate: 12.8 Gbps
Power Consumption Approximately 3 W
Power Supplies 1.1 V, 1.9 V

Key Features

  • High-Speed Sampling: Up to 6.4 GSPS in single-channel mode and up to 3.2 GSPS per channel in dual-channel mode.
  • Wide Input Frequency Range: Directly samples input frequencies from DC to above 10 GHz.
  • Buffered Analog Inputs: With an analog input bandwidth of 8.0 GHz and a common-mode voltage of 0 V.
  • Advanced Synchronization: Features noiseless aperture delay (TAD) adjustment and automatic SYSREF timing calibration.
  • Digital Down-Converters: Integrated DDCs in dual-channel mode for real and complex output decimation.
  • High-Speed Output Interface: JESD204B subclass-1 compliant with up to 16 lanes and a maximum lane rate of 12.8 Gbps.
  • Radiation Hardness: Total Ionizing Dose (TID) of 300 krad (Si) and Single Event Latchup (SEL) of 120 MeV-cm2/mg.

Applications

  • Communications Testers: Supports 802.11ad, 5G, and other high-bandwidth communication standards.
  • Satellite Communications (SATCOM): Suitable for satellite communication systems requiring high-speed data conversion.
  • Phased Array Radar, SIGINT, and ELINT: Ideal for advanced radar and signal intelligence applications.
  • Synthetic Aperture Radar (SAR): Used in SAR systems for high-resolution imaging.
  • Time-of-Flight and LIDAR Distance Measurement: Applicable in time-of-flight and LIDAR systems.
  • Oscilloscopes and Wideband Digitizers: Suitable for high-bandwidth oscilloscopes and digitizers.
  • Microwave Backhaul: Used in microwave backhaul systems for high-speed data transmission.
  • RF Sampling Software-Defined Radio (SDR): Ideal for SDR applications requiring direct RF sampling.
  • Spectrometry: Used in spectrometry applications for high-resolution signal analysis.

Q & A

  1. What is the maximum sampling rate of the ADC12DJ3200 in single-channel mode?

    The ADC12DJ3200 can sample up to 6.4 GSPS in single-channel mode.

  2. What is the maximum sampling rate of the ADC12DJ3200 in dual-channel mode?

    The ADC12DJ3200 can sample up to 3.2 GSPS per channel in dual-channel mode.

  3. What is the analog input bandwidth of the ADC12DJ3200?

    The analog input bandwidth is 8.0 GHz.

  4. What is the usable input frequency range of the ADC12DJ3200?

    The usable input frequency range exceeds 10 GHz.

  5. What type of output interface does the ADC12DJ3200 use?

    The ADC12DJ3200 uses a JESD204B subclass-1 compliant interface with up to 16 lanes.

  6. What are the power supply requirements for the ADC12DJ3200?

    The power supplies required are 1.1 V and 1.9 V.

  7. Is the ADC12DJ3200 radiation-hardened?

    Yes, the ADC12DJ3200 has a Total Ionizing Dose (TID) of 300 krad (Si) and Single Event Latchup (SEL) of 120 MeV-cm2/mg.

  8. What are some of the key applications of the ADC12DJ3200?

    The ADC12DJ3200 is used in communications testers, satellite communications, phased array radar, synthetic aperture radar, time-of-flight and LIDAR, oscilloscopes, microwave backhaul, RF sampling SDR, and spectrometry.

  9. Does the ADC12DJ3200 support digital down-conversion?

    Yes, the ADC12DJ3200 supports digital down-conversion in dual-channel mode with real and complex output decimation.

  10. What is the noise floor specification of the ADC12DJ3200?

    The noise floor is –151.8 dBFS/Hz in dual-channel mode and –154.6 dBFS/Hz in single-channel mode.

Product Attributes

Number of Bits:- 
Sampling Rate (Per Second):- 
Number of Inputs:- 
Input Type:- 
Data Interface:- 
Configuration:- 
Ratio - S/H:ADC:- 
Number of A/D Converters:- 
Architecture:- 
Reference Type:- 
Voltage - Supply, Analog:- 
Voltage - Supply, Digital:- 
Features:- 
Operating Temperature:- 
Package / Case:144-FBGA, FCBGA
Supplier Device Package:144-FCBGA (10x10)
Mounting Type:Surface Mount
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Similar Products

Part Number ADC12DJ3200AAVT ADC12DJ3200AAV
Manufacturer Texas Instruments Texas Instruments
Product Status Active Active
Number of Bits - 12
Sampling Rate (Per Second) - 3.2G
Number of Inputs - 1, 2
Input Type - Differential, Single Ended
Data Interface - JESD204B
Configuration - MUX-ADC
Ratio - S/H:ADC - 0:1
Number of A/D Converters - 2
Architecture - FLASH, SAR
Reference Type - Internal
Voltage - Supply, Analog - 1.05V ~ 1.15V, 1.8V ~ 2V
Voltage - Supply, Digital - 1.05V ~ 1.15V
Features - Simultaneous Sampling
Operating Temperature - -40°C ~ 85°C
Package / Case 144-FBGA, FCBGA 144-FBGA, FCBGA
Supplier Device Package 144-FCBGA (10x10) 144-FCBGA (10x10)
Mounting Type Surface Mount Surface Mount

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